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TRIPLE-S Microscope

Combined Scanning Electron-, Scanning Ion- and High-Speed Scanning Atomic Force Microscope

This project will create a triple-scanning microscope (TRIPLE-S) by merging a dual beam microscope with a novel high-speed atomic force microscope developed for high-speed nano- characterization in vacuum. This combination allows for a variety of novel analytical methods such as AFM/FIB tomography.
Acronym: 
TRIPLE-S Microscope
Project ID: 
8 213
Ranking: 
15
Cut-off: 
10
Start date: 
01-09-2013
Project Duration: 
40months
Project costs: 
2 310 620.00€
Technological Area: 
CHEMISTRY, PHYSICAL AND EXACT SCIENCES
Market Area: 
OTHER ELECTRONICS RELATED