Combined Scanning Electron-, Scanning Ion- and High-Speed Scanning Atomic Force Microscope
This project will create a triple-scanning microscope (TRIPLE-S) by merging a dual beam microscope with a novel high-speed atomic force microscope developed for high-speed nano- characterization in vacuum. This combination allows for a variety of novel analytical methods such as AFM/FIB tomography.
2 310 620.00€
CHEMISTRY, PHYSICAL AND EXACT SCIENCES
OTHER ELECTRONICS RELATED